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1

Meisterwerke aus Mangel an Inspiration. Autorschaft und Metafiktion in Fonsecas Diário de um fescenino und Fellinis 8½

Schamm, Christoph

Journal:

Year:

2008

Language:

german

File:

PDF, 180 KB

german, 2008

2

The African Traditional Ritual of Cleansing the Chest of Grudges as a Ritual of Reconciliation

Nolte-Schamm, Claudia

Journal:

Religion and Theology

Year:

2006

Language:

english

File:

PDF, 74 KB

english, 2006

3

Chlorine and oxygen inhibition effects in the deposition of SiC-based ceramics from the SiCHCl system

D. Lespiaux, F. Langlais, R. Naslain, S. Schamm, J. Sevely

Journal:

Journal of the European Ceramic Society

Year:

1995

Language:

english

File:

PDF, 1.04 MB

english, 1995

4

Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer

C. Dumas, J. Grisolia, G. BenAssayag, C. Bonafos, S. Schamm, A. Claverie, A. Arbouet, M. Carrada, V. Paillard, M. Shalchian

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2007

Language:

english

File:

PDF, 416 KB

english, 2007

5

Nanocrystallized tetragonal metastable ZrO2 thin films deposited by metal-organic chemical vapor deposition for 3D capacitors

M. Brunet, H. Mafhoz Kotb, L. Bouscayrol, E. Scheid, M. Andrieux, C. Legros, S. Schamm-Chardon

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 1.27 MB

english, 2011

6

Correlations between gas phase supersaturation, nucleation process and physico-chemical characteristics of silicon carbide deposited from Si-C-H-Cl system on silica substrates

D. Lespiaux, F. Langlais, R. Naslain, S. Schamm, J. Sevely

Journal:

Journal of Materials Science

Year:

1995

Language:

english

File:

PDF, 2.75 MB

english, 1995

7

Physicochemical properties of SiC-based ceramics deposited by low pressure chemical vapor deposition from CH3SiCl3H2

F. Loumagne, F. Langlais, R. Naslain, S. Schamm, D. Dorignac, J. Sévely

Journal:

Thin Solid Films

Year:

1995

Language:

english

File:

PDF, 1014 KB

english, 1995

8

Corrigendum to “Nanocrystallized tetragonal metastable ZrO2 thin films deposited by metal-organic chemical vapor deposition for 3D capacitors” [Thin Solid Films 519 (2011) 5638–5644]

M. Brunet, H. Mahfoz Kotb, L. Bouscayrol, E. Scheid, M. Andrieux, C. Legros, S. Schamm-Chardon

Journal:

Thin Solid Films

Year:

2012

Language:

english

File:

PDF, 87 KB

english, 2012

9

Structural characterization of amorphous SiCxNy chemical vapor deposited coatings

Bendeddouche, A., Berjoan, R., Beche, E., Merle-Mejean, T., Schamm, S., Serin, V., Taillades, G., Pradel, A., Hillel, R.

Journal:

Journal of Applied Physics

Year:

1997

Language:

english

File:

PDF, 452 KB

english, 1997

10

Partial phase diagram of the ternary reciprocal system KF-AlF3-Al2O3-K2O

Schamm, S., Rabaidel, L., Grannec, I., Naslain, R., Bernard, C., Relave, O.

Journal:

Year:

1990

Language:

english

File:

PDF, 1.26 MB

english, 1990

11

[IEEE 2013 IEEE Intelligent Vehicles Symposium (IV) - Gold Coast City, Australia (2013.06.23-2013.06.26)] 2013 IEEE Intelligent Vehicles Symposium (IV) - Towards driving autonomously: Autonomous cruise control in urban environments

Kohlhaas, Ralf, Schamm, Thomas, Lenk, Dominik, Zollner, J. Marius

Year:

2013

Language:

english

File:

PDF, 1.20 MB

english, 2013

12

Structural study and ferroelectricity of epitaxial BaTiO3 films on silicon grown by molecular beam epitaxy

Mazet, L., Bachelet, R., Louahadj, L., Albertini, D., Gautier, B., Cours, R., Schamm-Chardon, S., Saint-Girons, G., Dubourdieu, C.

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 2.46 MB

english, 2014

13

A description of the global land-surface precipitation data products of the Global Precipitation Climatology Centre with sample applications including centennial (trend) analysis from 1901–present

Becker, A., Finger, P., Meyer-Christoffer, A., Rudolf, B., Schamm, K., Schneider, U., Ziese, M.

Journal:

Earth System Science Data Discussions

Year:

2012

Language:

english

File:

PDF, 4.86 MB

english, 2012

14

Atomic scale characterization of SiO2/4H-SiC interfaces in MOSFETs devices

Beltrán, A.M., Duguay, S., Strenger, C., Bauer, A.J., Cristiano, F., Schamm-Chardon, S.

Journal:

Solid State Communications

Year:

2015

Language:

english

File:

PDF, 4.71 MB

english, 2015

15

Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopy

Stumpf, F., Abu Quba, A. A., Singer, P., Rumler, M., Cherkashin, N., Schamm-Chardon, S., Cours, R., Rommel, M.

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 4.53 MB

english, 2018

16

A Global ETCCDI-Based Precipitation Climatology from Satellite and Rain Gauge Measurements

Dietzsch, Felix, Andersson, Axel, Ziese, Markus, Schröder, Marc, Raykova, Kristin, Schamm, Kirstin, Becker, Andreas

Journal:

Year:

2017

Language:

english

File:

PDF, 14.62 MB

english, 2017

17

Compatibility between SiC filaments and aluminim in the K2ZrF6 wetting process and its effect on filament strength

S. Schamm, Y. Le Petitcorps, R. Naslain

Journal:

Composites Science and Technology

Year:

1991

Language:

english

File:

PDF, 1.22 MB

english, 1991

18

Reversibility and polarization behaviour of high temperature solid oxide electrochemical cells

E. Erdle, W. Dönitz, R. Schamm, A. Koch

Journal:

International Journal of Hydrogen Energy

Year:

1992

Language:

english

File:

PDF, 201 KB

english, 1992

19

Characterization of ZrO2 thin films deposited by MOCVD for high-density 3D capacitors

Magali Brunet, Emmanuel Scheid, Karolina Galicka-Fau, Michel Andrieux, Corinne Legros, Isabelle Gallet, Michaële Herbst, Sylvie Schamm

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 452 KB

english, 2009

20

Study of the chemical and structural organization of SIPOS films at the nanometer scale by TEM–EELS and XPS

S Schamm, R Berjoan, P Barathieu

Journal:

Materials Science and Engineering: B

Year:

2004

Language:

english

File:

PDF, 322 KB

english, 2004

21

Oxidation effects on transport characteristics of nanoscale MOS capacitors with an embedded layer of silicon nanocrystals obtained by low energy ion implantation

J. Grisolia, M. Shalchian, G. BenAssayag, H. Coffin, C. Bonafos, S. Schamm, S.M. Atarodi, A. Claverie

Journal:

Materials Science and Engineering: B

Year:

2005

Language:

english

File:

PDF, 262 KB

english, 2005

22

Structural and optical properties of high density Si-ncs synthesized in SiNx:H by remote PECVD and annealing

M. Carrada, A. Zerga, M. Amann, J.J. Grob, J.P. Stoquert, A. Slaoui, C. Bonafos, S. Schamm

Journal:

Materials Science and Engineering: B

Year:

2008

Language:

english

File:

PDF, 514 KB

english, 2008

23

Y2O3 nanoprecipitate/YBaCuO matrix interfaces: HREM study

D. Dorignac, S. Schamm, C. Grigis, J. Sévely, J. Santiso, A. Figueras

Journal:

Physica C: Superconductivity

Year:

1994

Language:

english

File:

PDF, 240 KB

english, 1994

24

Y2O3 nanoprecipitates in YBCO thin films obtained by thermal- MOCVD

J. Santiso, A. Figueras, S. Schamm, C. Grigis, D. Dorignac, J. Sévely

Journal:

Physica C: Superconductivity

Year:

1994

Language:

english

File:

PDF, 186 KB

english, 1994

25

Photoluminescence characterization of few-nanocrystals electronic devices

A. Arbouet, M. Carrada, F. Demangeot, V. Paillard, G. BenAssayag, C. Bonafos, A. Claverie, S. Schamm, C. Dumas, J. Grisolia, M.A.F. Van den Boogaart, J. Brugger, L. Doeswijk

Journal:

Journal of Luminescence

Year:

2006

Language:

english

File:

PDF, 320 KB

english, 2006

26

Oxide-nitride-oxide memory stacks formed by low-energy Si ion implantation into nitride and wet oxidation

V. Ioannou-Sougleridis, P. Dimitrakis, V.Em. Vamvakas, P. Normand, C. Bonafos, S. Schamm, N. Cherkashin, G. Ben Assayag, M. Perego, M. Fanciulli

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 1.04 MB

english, 2007

27

KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals

C. Dumas, L. Ressier, J. Grisolia, A. Arbouet, V. Paillard, G. BenAssayag, S. Schamm, P. Normand

Journal:

Microelectronic Engineering

Year:

2008

Language:

english

File:

PDF, 253 KB

english, 2008

28

Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing

D. Tsoutsou, G. Scarel, A. Debernardi, S.C. Capelli, S.N. Volkos, L. Lamagna, S. Schamm, P.E. Coulon, M. Fanciulli

Journal:

Microelectronic Engineering

Year:

2008

Language:

english

File:

PDF, 891 KB

english, 2008

29

Erratum to “Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing” Microelectronic Engineering 85 (2008) 2411–2413

D. Tsoutsou, G. Scarel, A. Debernardi, S.C. Capelli, S.N. Volkos, L. Lamagna, S. Schamm, P.E. Coulon, M. Fanciulli

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 161 KB

english, 2009

30

Ultra-low-energy ion-beam-synthesis of Ge nanocrystals in thin ALD Al2O3 layers for memory applications

P. Dimitrakis, A. Mouti, C. Bonafos, S. Schamm, G. Ben Assayag, V. Ioannou-Sougleridis, B. Schmidt, J. Becker, P. Normand

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 587 KB

english, 2009

31

Structural and electrical properties of Er-doped HfO2 and of its interface with Ge (0 0 1)

C. Wiemer, S. Baldovino, L. Lamagna, M. Perego, S. Schamm-Chardon, M. Fanciulli

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 535 KB

english, 2011

32

Structural and optical properties of Si nanocrystals embedded in SiO2/SiNx multilayers

F. Delachat, M. Carrada, G. Ferblantier, A. Slaoui, C. Bonafos, S. Schamm, H. Rinnert

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2009

Language:

english

File:

PDF, 381 KB

english, 2009

33

Silicon nanoparticles synthesized in SiO2 pockets by stencil-masked low energy ion implantation and thermal annealing

J. Grisolia, C. Dumas, G. Ben Assayag, C. Bonafos, S. Schamm, A. Arbouet, V. Paillard, M.A.F. van den Boogaart, J. Brugger, P. Normand

Journal:

Superlattices and Microstructures

Year:

2008

Language:

english

File:

PDF, 889 KB

english, 2008

34

Si nanocrystals by ultra-low-energy ion beam-synthesis for non-volatile memory applications

C. Bonafos, H. Coffin, S. Schamm, N. Cherkashin, G. Ben Assayag, P. Dimitrakis, P. Normand, M. Carrada, V. Paillard, A. Claverie

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 792 KB

english, 2005

35

Thermodynamic study and characterization of low pressure chemically vapor deposited silicon oxynitride films from tetraethylorthosilicate, dichlorosilane and ammonia gas mixtures

V.Em. Vamvakas, D. Davazoglou, R. Berjoan, S. Schamm, C. Vahlas

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 174 KB

english, 2003

36

Studies of LPCVD Al–Fe–O deposits by XPS, EELS and Mössbauer spectroscopies

Ch Labatut, R Berjoan, B Armas, S Schamm, J Sevely, A Roig, E Molins

Journal:

Surface and Coatings Technology

Year:

1998

Language:

english

File:

PDF, 480 KB

english, 1998

37

Contamination and the quantitative exploitation of EELS low-loss experiments

S. Schamm, G. Zanchi

Journal:

Ultramicroscopy

Year:

2001

Language:

english

File:

PDF, 168 KB

english, 2001

38

Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materials

S. Schamm, G. Zanchi

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 137 KB

english, 2003

39

Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7−δ thin films

Ch Grigis, S Schamm

Journal:

Ultramicroscopy

Year:

1998

Language:

english

File:

PDF, 314 KB

english, 1998

40

Fabrication of nanocrystal memories by ultra low energy ion implantation

N. Cherkashin, C. Bonafos, H. Coffin, M. Carrada, S. Schamm, G. Ben Assayag, D. Chassaing, P. Dimitrakis, P. Normand, M. Perego, M. Fanciulli, T. Muller, K. H. Heinig, A. Claverie

Journal:

physica status solidi (c)

Year:

2005

Language:

english

File:

PDF, 267 KB

english, 2005

41

Photoluminescence spectroscopy and transport electrical measurements reveal the quantized features of Si nanocrystals embedded in an ultra thin SiO2 layer

C. Dumas, J. Grisolia, M. Carrada, A. Arbouet, V. Paillard, G. Ben Assayag, C. Bonafos, S. Schamm, A. Claverie

Journal:

physica status solidi (c)

Year:

2007

Language:

english

File:

PDF, 250 KB

english, 2007

42

Si nanocrystals by ultra-low energy ion implantation for non-volatile memory applications

H. Coffin, C. Bonafos, S. Schamm, M. Carrada, N. Cherkashin, G. Ben Assayag, P. Dimitrakis, P. Normand, M. Respaud, A. Claverie

Journal:

Materials Science and Engineering: B

Year:

2005

Language:

english

File:

PDF, 165 KB

english, 2005

43

Imaging Si nanoparticles embedded in SiO2 layers by (S)TEM-EELS

S. Schamm, C. Bonafos, H. Coffin, N. Cherkashin, M. Carrada, G. Ben Assayag, A. Claverie, M. Tencé, C. Colliex

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 2.02 MB

english, 2008

44

The K2ZrF6wetting process: Effect of surface chemistry on the ability of a SiC-Fiber preform to be impregnated by aluminum

S. Schamm, R. Fedou, J. P. Rocher, J. M. Quenisset, R. Naslain

Journal:

Metallurgical and Materials Transactions A

Year:

1991

Language:

english

File:

PDF, 773 KB

english, 1991

45

Implantation energy effect on photoluminescence spectroscopy of Si nanocrystals locally fabricated by stencil-masked ultra-low-energy ion-beam-synthesis in silica

R. Diaz, C. Suarez, A. Arbouet, R. Marty, V. Paillard, F. Gloux, C. Bonafos, S. Schamm-Chardon, J. Grisolia, P. Normand, P. Dimitrakis, G. BenAssayag

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2012

Language:

english

File:

PDF, 517 KB

english, 2012

46

Sixteen- and Seventeen-Year-Olds Under the Juvenile Court Law of Pennsylvania: Sound and Adequate Provisions for the Youthful Offender

GUSTAV L. SCHAMM

Journal:

Juvenile and Family Court Journal

Year:

1956

Language:

english

File:

PDF, 320 KB

english, 1956

47

V.U.V absorption coefficient measurements of borate matrices

B Moine, J Mugnier, D Boyer, R Mahiou, S Schamm, G Zanchi

Journal:

Journal of Alloys and Compounds

Year:

2001

Language:

english

File:

PDF, 138 KB

english, 2001

48

[IEEE 2010 IEEE Intelligent Vehicles Symposium (IV) - La Jolla, CA, USA (2010.06.21-2010.06.24)] 2010 IEEE Intelligent Vehicles Symposium - On-road vehicle detection during dusk and at night

Schamm, Thomas, von Carlowitz, Christoph, Zollner, J. Marius

Year:

2010

Language:

english

File:

PDF, 1.78 MB

english, 2010

49

Combining HRTEM–EELS nano-analysis with capacitance–voltage measurements to evaluate high-κ thin films deposited on Si and Ge as candidate for future gate dielectrics

S. Schamm-Chardon, P.E. Coulon, L. Lamagna, C. Wiemer, S. Baldovino, M. Fanciulli

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 433 KB

english, 2011

50

SiCN Amorphous Materials Chemical Vapour Deposited Using the Si(CH 3 ) 4 -NH 3 -H 2 System

Bendeddouche, A., Berjoan, R., Bêche, E., Schamm, S., Serin, V., Carles, R., Hillel, R.

Journal:

Journal de Physique IV (Proceedings) /Le Journal de Physique IV

Year:

1995

Language:

english

File:

PDF, 490 KB

english, 1995